Traditional Petrographic

Use: Transmitted light optical petrographic analysis. Wikipedia 

Preparation: S and L formats available. Embedded in clear resin, mounted with acrylic to standard petrographic glass, final lapping with 18 µm abrasive to standard final thickness of 30 µm. Coverglass strongly recommended. 


Electron Microprobe

Use: Electron microprobe analysis (EMPA); also electron probe microanalysis (EPMA). Wikipedia

Preparation: S, L and R formats available. Embedded in clear resin, mounted with acrylic to standard petrographic glass, polished with 0.5 µm diamond abrasive to standard final thickness of 30 µm.


Use: Ultra-small volume grain mounts, single-grain mounts, ultra-thin samples.

Preparation: Varies based on material. Please email a description of your materials and analysis - or better yet, send us your materials. We'll work with you to determine the appropriate preparation for your analysis. 

Custom Preparations


CL

Use: Cathodoluminescence microscopy. Wikipedia

Preparation: S, L and R formats available. Embedded in clear resin, mounted with acrylic to standard petrographic glass, polished with 0.5 µm diamond abrasive to standard final thickness of 30 µm.


Use: Electron backscatter diffraction analysis. Wikipedia

Preparation: S, L and R formats available. Embedded in clear resin, mounted with acrylic to standard petrographic glass, polished with 0.5 µm diamond abrasive to standard final thickness of 30 µm. Extra polishing with colloidal silica is currently being performed by end users.

EBSD


Use: Fluid inclusion analysis. Wikipedia

Preparation: S, L and R formats available. Embedded in clear resin, mounted with superglue to standard petrographic glass, two-sided polish with 0.5 µm diamond abrasive to user-specified thickness (typically 150 µm).

Fluid Inclusion


Use: Fourier-transform infrared spectroscopy. Wikipedia

Preparation: Varies depending on transmission vs. internal reflectance handling technique. See Thermofisher's FTIR Sample Handling Techniques.

FTIR


Use: Laser ablation induction coupled plasma mass spectrometry.. Wikipedia

Preparation: S, L and R formats available. Embedded in clear resin, mounted with acrylic to standard petrographic glass, polished with 0.5 µm diamond abrasive to user-specified thickness (typically 150 µm).

LA-ICP-MS


Use: Neutron scattering analyses. Wikipedia

Preparation: S format only. Embedded in clear resin, mounted with superglue to GE-124 Quartz glass, polished with 0.5 µm diamond abrasive to user-specified thickness (typically 150µm).

Neutron Scattering


Raman

Use: Raman spectroscopy. Wikipedia

Preparation: Varies depending on other intended analyses.


Use: Scanning electron microscopy. Wikipedia

Preparation: S, L and R formats available. Embedded in clear resin, mounted with acrylic to standard petrographic glass, polished with 0.5 µm diamond abrasive to standard final thickness of 30 µm.

SEM


Use: Secondary ion mass spectrometry. SHRIMP is a variety of SIMS analysis. Wikipedia

Preparation: S and R formats available. Embedded in clear resin, mounted with acrylic to standard petrographic glass, polished with 0.5 µm diamond abrasive to standard final thickness of 30 µm.

SIMS / nano-SIMS


Use: Synchrotron X-ray diffraction analysis. Wikipedia

Preparation: S and R formats available. Embedded in clear resin, mounted with superglue to standard petrographic glass, two-sided polish with 0.5 µm diamond abrasive to standard final thickness of 30 µm. XRD is commonly performed in conjunction with XRF, in which case XRF prep takes precedence.

Synchrotron XRD


Use: Synchrotron X-ray fluorescence spectroscopy. Wikipedia

Preparation: S and R formats available. Embedded in clear resin, mounted with superglue to Suprasil 2A Quartz glass, polished with 0.5 µm diamond abrasive to standard final thickness of 30 µm.

Combined Synchrotron XRD and XRF: XRF preparation as detailed above, also including double-sided polish.

Synchrotron XRF


Use: Transmission electron microscopy and focused ion-beam analysis. Wikipedia

Preparation: S format only. Embedded in clear resin, mounted with Crystalbond 509 to standard petrographic glass, polished with 0.5 µm diamond abrasive to standard final thickness of 30 µm.

TEM / FIB


Use: X-ray absorption spectroscopy. Also known as XANES or NEXAFS. Wikipedia

Preparation: Often combined with Synchrotron XRF and XRD. Varies depending on other intended analyses.

XAS


Use: Transmitted and/or reflected light analysis of rock minerals, textures and structures to interpret geologic processes, protolith and accurate rock classifications. Report delivered electronically via DropBox.

Typically starting at $175 per sample, including sample preparation and photomicrography. Please check with us regarding our current backlog and schedule. 

Preparation: S and L formats available. Embedded in clear resin, mounted with acrylic to standard petrographic glass, final lapping with 18 µm abrasive to standard final thickness of 30 µm. Mineral stains optional. Coverglass strongly recommended.

Petrographic Analysis


Use: Presenting petrographic information.

Starting at $25 per sample.

Preparation: Digital photomicrography and digital film scanner images of thin sections in XPL and PPL. Delivered electronically via DropBox.

 

Digital Imaging